Date of Award
January 2016
Degree Type
Dissertation
Degree Name
Doctor of Philosophy (PhD)
Department
Electrical and Computer Engineering
First Advisor
Ali Shakouri
Committee Member 1
Charles Bouman
Committee Member 2
Mark Lundstrom
Committee Member 3
Ganesh Subbarayan
Abstract
Electrothermal effects are crucial in the design and optimization of electronic devices. Thermoreflectance (TR) imaging enables transient thermal characterization at submicron to centimeter scales. Typically, finite element methods (FEM) are used to calculate the temperature profile in devices and ICs with complex geometry. By comparing theory and experiment, important material parameters and device characteristics are extracted. In this work we combine TR and FEM with image blurring/reconstruction techniques to improve electrothermal characterization of micron and nanoscale devices.
Recommended Citation
Ziabari, Amir Koushyar, "FINITE ELEMENT AND IMAGING APPROACHES TO ANALYZE MULTISCALE ELECTROTHERMAL PHENOMENA" (2016). Open Access Dissertations. 1278.
https://docs.lib.purdue.edu/open_access_dissertations/1278