Abstract
A correlation between growth temperature and electrical resistance of multiwalled carbon nanotubes (MWNTs) has been established by measuring the resistance of individual MWNTs grown by microwave plasma-enhanced chemical vapor deposition (PECVD) at 800, 900, and 950 degrees C. The lowest resistances were obtained mainly from MWNTs grown at 900 degrees C. The MWNT resistance is larger on average at lower (800 degrees C) and higher (950 degrees C) growth temperatures. The resistance of MWNTs correlated well with other MWNT quality indices obtained from Raman spectra. This study identifies a temperature window for growing higher-quality MWNTs with fewer defects and lower resistance by PECVD.
Published in:
Applied Physics Letters 91,9 (2007) 093105 1-3;
Link to original published article:
http://dx.doi.org/10.1063/1.2776022
Keywords
Physics, Applied
Date of Version
January 2007
Recommended Citation
Lan, C.; Amama, P. B.; Fisher, T. S.; and Reifenberger, R. G., "Correlating electrical resistance to growth conditions for multiwalled carbon
nanotubes" (2007). Department of Physics and Astronomy Faculty Publications. Paper 629.
https://docs.lib.purdue.edu/physics_articles/629