Published in:
Applied Physics Letters 88,19 (2006) 193108;
Link to original published article:
http://dx.doi.org/10.1063/1.2202132
Abstract
We propose a mode of dynamic scanning probe microscopy based on parametric resonance for highly sensitive nanoscale imaging and force spectroscopy. In this mode the microcantilever probe is excited by means of a closed-loop electronic circuit that modulates the microcantilever stiffness at a frequency close to twice its natural resonance frequency. Under ambient conditions this parametric pumping leads to self-sustained oscillations in a narrow frequency bandwidth thereby resulting in exquisitely sharp, controllable, and non-Lorentzian resonance peaks. We discuss and demonstrate the potential of imaging and force spectroscopy using this mode. (c) 2006 American Institute of Physics.
Keywords
atomic-force microscopy;; amplification
Date of this Version
January 2006