Abstract
In many microscopy image analysis applications, it is of critical importance to address
Degree Type
Dissertation
Degree Name
Doctor of Philosophy (PhD)
Department
Electrical and Computer Engineering
Date of Award
January 2016
Recommended Citation
Zhao, Huixi, "COMBINING MARKOV RANDOM FIELD AND MARKED POINT PROCESS FOR MICROSCOPY IMAGE MODELING" (2016). Open Access Dissertations. 1377.
https://docs.lib.purdue.edu/open_access_dissertations/1377
First Advisor
Mary L. Comer
Committee Member 1
Charles A. Bouman
Committee Member 2
Edward J. Delp
Committee Member 3
Mark R. Bell
COinS