Shot Noise Thermometry for Thermal Characterization of Templated Carbon Nanotubes

Author

• Robert A. Sayer, Birck Nanotechnology Center and School of Mechanical Engineering, Purdue UniversityFollow
• Sunkook Kim, Purdue University - Main CampusFollow
• Aaron D. Franklin, Birck Nanotechnology Center and School of Electrical and Computer Engineering, Purdue UniversityFollow
• Saeed Mohammadi, School of Electrical and Computer Engineering, Purdue UniversityFollow
• Timothy Fisher, Birck Nanotechnology Center and School of Electrical and Computer Engineering, Purdue UniversityFollow

Abstract

A carbon nanotube (CNT) thermometer that operates on the principles of electrical shot noise is reported. Shot noise thermometry is a self-calibrating measurement technique that relates statistical fluctuations in dc current across a device to temperature. A structure consisting of vertical, top, and bottom-contacted single-walled carbon nanotubes in a porous anodic alumina template was fabricated and used to measure shot noise. Frequencies between 60 and 100 kHz were observed to preclude significant influence from 1/f noise, which does not contain thermally relevant information. Because isothermal models do not accurately reproduce the observed noise trends, a self-heating shot noise model has been developed and applied to experimental data to determine the thermal resistance of a CNT device consisting of an array of vertical single-walled CNTs supported in a porous anodic alumina template. The thermal surface resistance at the nanotube-dielectric interface is found to be 1.5 x 10(8) K/W, which is consistent with measurements by other techniques.

Keywords

Carbon nanotubes; electrical noise; thermal resistance

Date of this Version

3-2010

Recommended Citation

Sayer, Robert A.; Kim, Sunkook; Franklin, Aaron D.; Mohammadi, Saeed; and Fisher, Timothy, "Shot Noise Thermometry for Thermal Characterization of Templated Carbon Nanotubes" (2010). Birck and NCN Publications. Paper 608.
https://docs.lib.purdue.edu/nanopub/608