Microscale Temperature Measurements Near the Triple Line of an Evaporating Thin Liquid Film
Abstract
Thin-film evaporation from a meniscus in a confined space, which is the basis for many two-phase cooling devices, is experimentally investigated. The meniscus formed by heptane, a highly wetting liquid, on a heated fused quartz wafer is studied. Microscale infrared temperature measurements performed near the thin-film region of the evaporating meniscus reveal the temperature suppression caused by the intensive evaporation in this region. The high spatial resolution (similar to 6.3 mu m) and high temperature sensitivity (similar to 20 mK) of the infrared camera allow for improved accuracy in the measurements. The effects of evaporation rate, applied heat flux, and channel width on the thin-film heat transfer distribution are also explored.
Keywords
evaporation; infrared imaging; liquid films; organic compounds
Date of this Version
6-2009
Recommended Citation
Dhavaleswarapu, Hemanth K.; Garimella, Suresh; and Murthy, Jayathi Y., "Microscale Temperature Measurements Near the Triple Line of an Evaporating Thin Liquid Film" (2009). Birck and NCN Publications. Paper 384.
https://docs.lib.purdue.edu/nanopub/384