Toward surround gates on vertical single-walled carbon nanotube devices

Aaron D. Franklin, Birck Nanotechnology Center and School of Electrical and Computer Engineering, Purdue University
Robert A. Sayer, Birck Nanotechnology Center and School of Mechanical Engineering, Purdue University
Timothy D. Sands, Birck Nanotechnology Center, School of Electrical and Computer Engineering and School of Materials Engineering, Purdue University
Timothy Fisher, Birck Nanotechnology Center and School of Mechanical Engineering, Purdue University
David B. Janes, Birck Nanotechnology Center and School of Electrical and Computer Engineering, Purdue University

Date of this Version

3-30-2009

Citation

DOI: 10.1116/1.3054266

This document has been peer-reviewed.

 

Abstract

The one-dimensional, cylindrical nature of single-walled carbon nanotubes (SWCNTs) suggests that the ideal gating geometry for nanotube field-effect transistors (FETs) is a surround gate (SG). Using vertical SWCNTs templated in porous anodic alumina, SGs are formed using top-down processes for the dielectric/metal depositions and definition of the channel length. Surround gates allow aggressive scaling of the channel to 25% of the length attainable with a bottom-gate geometry without incurring short-channel effects. The process demonstrated here for forming SGs on vertical SWCNTs is amenable for large-scale fabrication of multinanotube FETs.

Discipline(s)

Nanoscience and Nanotechnology

 

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