Abstract
A focused ion beam (FIB) is used to sequentially reduce the contact length of an evaporated metal film to a multiwalled carbon nanotube (MWCNT). By using this FIB contact cutback technique, the contact resistance between an individual MWCNT and evaporated thin films of Au, Au/Ti, and Ag are accurately determined. The data permit a rational way to specify the minimum contact length of a metallic thin film to a MWCNT.
Citation
APPLIED PHYSICS LETTERS 92, 213112
Date of this Version
May 2008
Recommended Citation
Lan, Chun; Zakharov, Dmitri; and Reifenberger, R., "Determining the optimal contact length for a metal/multiwalled carbon nanotube interconnect" (2008). Birck and NCN Publications. Paper 167.
https://docs.lib.purdue.edu/nanopub/167
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