The origin of interferometric effect involving surface plasmon polariton in scattering near-field scanning optical microscopy
Abstract
Scattering near-field scanning optical microscopy (s-NSOM) has been developed to characterize optical near field with spatial resolution on the order of 10 nm. In this work we report investigation of the interferometric patterns commonly occurred in s-NSOM measurements. To reveal the origin of such interference patterns, a simple nanoslit is used. Comparing the measured result with a simplified analytical model as well as full-field numerical simulations, it is shown that the interference pattern is predominantly formed by the in-plane component of incidence light and surface plasmon polariton (SPP) launched by the nanoslit. This result helps to understand the responses of plasmonic nanostructures during s-NSOM measurements. (C)2014 Optical Society of America
Keywords
TIP, LIGHT
DOI
10.1364/OE.22.002965
Date of this Version
2-10-2014
Recommended Citation
Li, Yan; Zhou, Nan; Kinzel, Edward C.; Ren, Xifeng; and Xu, Xianfan, "The origin of interferometric effect involving surface plasmon polariton in scattering near-field scanning optical microscopy" (2014). Birck and NCN Publications. Paper 1514.
http://dx.doi.org/10.1364/OE.22.002965