Parametric resonance based scanning probe microscopy

Author

• M. Moreno-Moreno, Laboratorio de Nuevas Microscopías, Departamento de Física de la Materia Condensada, Universidad Autónoma de Madrid
• Arvind Raman, Birck Nanotechnology Center and School of Mechanical Engineering, Purdue UniversityFollow
• J. Gomez-Herrero, Laboratorio de Nuevas Microscopías, Departamento de Física de la Materia Condensada, Universidad Autónoma de Madrid
• R. Reifenberger, Birck Nanotechnology Center and Department of Physics, Purdue UniversityFollow

Abstract

We propose a mode of dynamic scanning probe microscopy based on parametric resonance for highly sensitive nanoscale imaging and force spectroscopy. In this mode the microcantilever probe is excited by means of a closed-loop electronic circuit that modulates the microcantilever stiffness at a frequency close to twice its natural resonance frequency. Under ambient conditions this parametric pumping leads to self-sustained oscillations in a narrow frequency bandwidth thereby resulting in exquisitely sharp, controllable, and non-Lorentzian resonance peaks. We discuss and demonstrate the potential of imaging and force spectroscopy using this mode.

Citation

Applied Physics Letters 88, 193108 (2006)

Date of this Version

July 2006

Recommended Citation

Moreno-Moreno, M.; Raman, Arvind ; Gomez-Herrero, J.; and Reifenberger, R., "Parametric resonance based scanning probe microscopy" (2006). Birck and NCN Publications. Paper 15.
https://docs.lib.purdue.edu/nanopub/15