Abstract
In this work, we explore the thermal properties of hexagonal transition metal dichalcogenide compounds with different average atomic masses but equivalent microstructures. Thermal conductivity values of sputtered thin films were compared to bulk crystals. The comparison revealed a > 10 fold reduction in thin film thermal conductivity. Structural analysis of the films revealed a turbostratic structure with domain sizes on the order of 5-10 nm. Estimates of phonon scattering lengths at domain boundaries based on computationally derived group velocities were consistent with the observed film microstructure, and accounted for the reduction in thermal conductivity compared to values for bulk crystals. (C) 2013 American Institute of Physics. [http://dx.doi.org/10.1063/1.4793203]
Keywords
THIN-FILMS; PYROLYTIC GRAPHITE; MOS2; CONDUCTIVITY; CRYSTALS; SPECTRA; GROWTH
DOI
10.1063/1.4793203
Citation
Appl. Phys. Lett. 102, 081604 (2013)
Date of this Version
2-25-2013
Recommended Citation
Muratore, C.; Varshney, V.; Gengler, J. J.; Hu, J. J.; Bultman, J. E.; Smith, T. M.; Shamberger, P. J.; Qiu, Bo; Ruan, Xiulin; Roy, A. K.; and Voevodin, A. A., "Cross-plane thermal properties of transition metal dichalcogenides" (2013). Birck and NCN Publications. Paper 1349.
http://dx.doi.org/10.1063/1.4793203
Comments
Copyright (2013) American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Appl. Phys. Lett. 102, 081604 (2013) and may be found at http://dx.doi.org/10.1063/1.4793203. The following article has been submitted to/accepted by Applied Physics Letters. Copyright (2013) C. Muratore, V. Varshney, J. J. Gengler, J. J. Hu, J. E. Bultman, T. M. Smith, P. J. Shamberger, B. Qiu, X. Ruan, A. K. Roy and A. A. Voevodin. This article is distributed under a Creative Commons Attribution 3.0 Unported License.