A grain boundary phase transition in Si-Au

Shuailei Ma, Lehigh University
Kaveh Meshinchi Asl, Clemson University
Chookiat Tansarawiput, Birck Nanotechnology Center, Purdue University
Patrick R. Cantwell, Lehigh University
Minghao Qi, Birck Nanotechnology Center, Purdue University
Martin P. Harmer, Lehigh University
Jian Luo, Clemson University

Abstract

A grain boundary transition from a bilayer to an intrinsic (nominally clean) boundary is observed in Si-Au. An atomically abrupt transition between the two complexions (grain boundary stabilized phases) implies the occurrence of a first-order interfacial phase transition associated with a discontinuity in the interfacial excess. This observation supports a grain-boundary complexion theory with broad applications. This transition is atypical in that the monolayer complexion is absent. A model is proposed to explain the bilayer stabilization and the origin of this complexion transition. (C) 2011 Acta Materialia Inc. Published by Elsevier Ltd. All rights reserved.

Discipline(s)

Nanoscience and Nanotechnology