Abstract
Summary:
Traps at interfaces and bulks of oxides has always been a problem.
Efforts have been made to interpret trapping phenomena using essential, but simple, physics.
Modeling of these irreversible phenomena has innovative technological implications: (1) Optimization between off-state power and reliability (2) Degradation-free transistor
Date of this Version
April 2008
COinS
Comments
Poster for 2008 Research Review