Characterization of random scattering media and related information retrieval

Zhenyu Wang, Purdue University

Abstract

There has been substantial interest in optical imaging in and through random media in applications as diverse as environmental sensing and tumor detection. The rich scatter environment also leads to multiple paths or channels, which may provide higher capacity for communication. Coherent light passing through random media produces an intensity speckle pattern when imaged, as a result of multiple scatter and the imaging optics. When polarized coherent light is used, the speckle pattern is sensitive to the polarization state, depending on the amount of scatter, and such measurements provide information about the random medium. This may form the basis for enhanced imaging of random media and provide information on the scatterers themselves. Second and third order correlations over laser scan frequency are shown to lead to the ensemble averaged temporal impulse response, with sensitivity to the polarization state in the more weakly scattering regime. A new intensity interferometer is introduced that provides information about two signals incident on a scattering medium. The two coherent beams, which are not necessarily overlapping, interfere in a scattering medium. A sinusoidal modulation in the second order intensity correlation with laser scan frequency is shown to be related to the relative delay of the two incident beams. An intensity spatial correlation over input position reveals that decorrelation occurs over a length comparable to the incident beam size. Such decorrelation is also related to the amount of scatter. Remarkably, with two beams incident at different angles, the intensity correlation over the scan position has a sinusoidal modulation that is related to the incidence angle difference between the two input beams. This spatial correlation over input position thus provides information about input wavevectors.

Degree

Ph.D.

Advisors

Webb, Purdue University.

Subject Area

Electrical engineering|Optics

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