Nonlinear optical ellipsometry
Abstract
Nonlinear optical ellipsometry was developed to interpret polarization information of the second harmonic generated (SHG) light at thin-surface films. The experimentally simple instrument design allows for a mathematically straightforward evaluation of the data and yields greater information content than comparable intensity based techniques. The polarization-dependence of the SHG light yields the fully complex-valued χ(2) nonlinear susceptibility tensor elements. The χ(2) tensor elements can then be related back to the structure of molecules at the silica/aqueous solution interface. Nonlinear optical null ellipsometry for signal isolation has allowed detection of the adsorption of bovine serum albumin at the silica/aqueous solution interface in real time and without requiring the use of labeled protein. The appearance of aggregation on nonlinear optical surfaces is also studied.
Degree
Ph.D.
Advisors
Simpson, Purdue University.
Subject Area
Analytical chemistry|Chemistry
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