Applications of special X-ray diffraction cases in silicon crystals
Abstract
The purpose of this study is to examine two situations in which non-standard cases of X-ray diffraction play an important practical role. This study concentrates on diffraction from silicon crystals because of their frequent use in X-ray diffraction applications due to their high degree of perfection. The first situation is that of Bragg reflection in backscattering, which has been employed for X-ray mono chromatization, energy analysis, and other tasks. Multiple-beam excitations have been found to be unavoidable for backscattering of hard X-rays, and can affect the crystal's performance. Detailed angular curves of the (12 4 0) Bragg reflection at backscattering are included and compared to the predictions of dynamical diffraction theory. Intensity data of the accompanying reflected beams are also provided. Before this study, little experimental data had been collected on such multiple-beam effects. The second situation is the use of three-beam-case diffraction to construct a novel X-ray Michelson interferometer. It had been hoped that such a device could be used as a spectrometer with μeV to meV energy resolution. It has been demonstrated that an incident beam may be split and recombined by this method, and that the resultant beam has acceptable intensity when a third-generation synchrotron source is used. Interference fringes were not observed in the several tests that were performed. However, the tests helped to specify the problems leading to the lack of interference, and are thus expected to prove useful for future research in this topic.
Degree
Ph.D.
Advisors
Colella, Purdue University.
Subject Area
Physics
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