Hessian fly-resistance from durum wheat mapped in bread wheat
Abstract
The insect pest, Hessian fly (Mayetiola destructor Say), causes significant wheat (Triticum aestivum L.) yield losses in many regions globally. Yield reductions of 66-68% and test weight reductions of two U.S. market grades have been recorded for wheat with moderate levels of infestation (Smiley et al., 2004). The goal of this research was to provide newly characterized germplasm containing resistance genes that are effective against the Hessian fly in specific regions of the United States. Mapping populations of tetraploid (D6647/PI 134942) and hexaploid (Len/97211) wheat were developed for characterization of the resistance gene(s). Over 100 F2:3 families of each population were screened for Hessian fly-resistance using the Hessian fly genotype virH13. Seventy-eight simple sequence repeats (SSRs) located on chromosomes 2B and 3A were screened on the respective populations to identify markers that were polymorphic and codominant. Using five markers, hexaploid F2 plants were genotyped and the data combined with F2:3 phenotypic information to develop linkage maps, using JoinMap® 4. One partially dominant gene conferring resistance to Hessian fly was identified in the wheat line 97211. This resistance was derived from the tetraploid wheat line, PI 134942. Marker analysis revealed the location of the resistance gene to be on the distal end of the short arm of chromosome 3A. It appeared that more than one gene confers resistance in PI 134942. The resistance gene identified provides effective protection against all populations of Hessian fly tested. If deployed, pyramiding with an additional undeployed resistance gene or transgene may help to conserve the longevity of the resistance genes.
Degree
M.S.
Advisors
Williams, Purdue University.
Subject Area
Agronomy|Genetics
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