Atomic force microscopy analysis of complex materials

Hank T Thompson, Purdue University

Abstract

Nanoscale characterization technology enables researchers to fundamentally understand materials at a level once thought unattainable. The development and deployment of advanced materials is paramount to the USA's prolonged influence in the materials industry. The development of advanced materials requires a knowledge base that spans multiple scales, from the macro to the nano. Of particular interest is the atomic force microscope (AFM) which allows the non-invasive analysis of materials in their natural habitat, be it air or liquid. The AFM has gained interest due to its ability to obtain images with atomic resolution. Using the AFM, scientists can perform a plethora of experiments using multiple techniques to gain valuable knowledge concerning mechanical, electrical, and thermal properties at the nanoscale. Through the theoretical models and experimental data, much can be gained and this understanding will aid in the expedited development of advanced materials. In this thesis, two advanced materials are studied: polymer-carbon nanotube (CNT) nanocomposites and bitumen. The AFM is used to study subsurface CNT dispersion and connectivity within the nanocomposite and the nanoscale structure of neat and modified bitumen. This work may be of importance when either subsurface, nanoscale surface or both characterization techniques are necessary.

Degree

M.S.M.E.

Advisors

Raman, Purdue University.

Subject Area

Mechanical engineering|Nanoscience

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