Microscale Temperature Measurements Near the Triple Line of an Evaporating Thin Liquid Film

Hemanth K. Dhavaleswarapu, Purdue University - Main Campus
Suresh Garimella, School of Mechanical Engineering
Jayathi Y. Murthy, School of Mechanical Engineering, Purdue University

Date of this Version

6-2009

Citation

Journal of Heat Transfer JUNE 2009, Vol. 131 / 061501-1

This document has been peer-reviewed.

 

Abstract

Thin-film evaporation from a meniscus in a confined space, which is the basis for many two-phase cooling devices, is experimentally investigated. The meniscus formed by heptane, a highly wetting liquid, on a heated fused quartz wafer is studied. Microscale infrared temperature measurements performed near the thin-film region of the evaporating meniscus reveal the temperature suppression caused by the intensive evaporation in this region. The high spatial resolution (similar to 6.3 mu m) and high temperature sensitivity (similar to 20 mK) of the infrared camera allow for improved accuracy in the measurements. The effects of evaporation rate, applied heat flux, and channel width on the thin-film heat transfer distribution are also explored.

Discipline(s)

Nanoscience and Nanotechnology

 

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