Keywords

EMC, Signal Integrity, Noise immunity

Select the category the research project fits.

Innovative Technology/Entrepreneurship/Design

Is this submission part of ICaP/PW (Introductory Composition at Purdue/Professional Writing)?

No

Abstract

Title: Immunity Tests of a Class-D Audio Amplifier. By Siddharth Inani, Raghul Prakash, Yuichiro Suzuki, Krister Ulvog, Fiyi Ogunkoya Abstract This work tests the immunity of a Class-D Audio Amplifier which uses the Texas Instruments TPA3122D2 integrated circuit. Its output signal performance and integrity when exposed to a controlled electric field source was investigated. This study was conducted to determine the best PCB layout practices for digital switching circuits that operate at high frequencies which would lead to better EMC design practices. A high intensity E-field near-field probe was designed and constructed and applied to different points on the printed circuit board of the amplifier. E-Field intensities and output signal distortion were measured using calibrated near-field probes, a spectrum analyzer, and an oscilloscope. The results indicated that as the intensity of the E-field increased, the signal integrity of the integrated circuit of the Amplifier was increasingly affected and the signal output of the Amplifier was severely distorted. Also, it was found that the output waveform was distorted when the E-field source was of high frequency but at relatively low frequencies the coupling capacitor that we added at Stage 1 of the circuitry was able to shunt out the noise.

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Immunity Tests of a Class-D Audio Amplifier.

Title: Immunity Tests of a Class-D Audio Amplifier. By Siddharth Inani, Raghul Prakash, Yuichiro Suzuki, Krister Ulvog, Fiyi Ogunkoya Abstract This work tests the immunity of a Class-D Audio Amplifier which uses the Texas Instruments TPA3122D2 integrated circuit. Its output signal performance and integrity when exposed to a controlled electric field source was investigated. This study was conducted to determine the best PCB layout practices for digital switching circuits that operate at high frequencies which would lead to better EMC design practices. A high intensity E-field near-field probe was designed and constructed and applied to different points on the printed circuit board of the amplifier. E-Field intensities and output signal distortion were measured using calibrated near-field probes, a spectrum analyzer, and an oscilloscope. The results indicated that as the intensity of the E-field increased, the signal integrity of the integrated circuit of the Amplifier was increasingly affected and the signal output of the Amplifier was severely distorted. Also, it was found that the output waveform was distorted when the E-field source was of high frequency but at relatively low frequencies the coupling capacitor that we added at Stage 1 of the circuitry was able to shunt out the noise.