Cross section measurements of high-p(T) dilepton final-state processes using a global fitting method
Published in:
Physical Review D 78,1 ( 2008 )
Abstract
We present a new method for studying high-p(T) dilepton events (e(+/-)e(-/+), mu(+/-)mu(-/+), e(+/-)mu(-/+)) and simultaneously extracting the production cross sections of p (p) over bar -> t (t) over bar, p (p) over bar -> W+W-, and p (p) over bar -> Z(0) -> tau(+)tau(-) at a center-of-mass energy of root s = 1.96 TeV. We perform a likelihood fit to the dilepton data in a parameter space defined by the missing transverse energy and the number of jets in the event. Our results, which use 360 pb(-1) of data recorded with the CDF II detector at the Fermilab Tevatron Collider, are sigma(t (t) over bar) = 8.5(-2.2)(+2.7) pb, sigma(W+W-) = 16.3(-4.4)(+5.2) pb, and sigma(Z(0) -> tau(+)tau(-)) = 291(-46)(+50) pb.
Keywords
Astronomy & Astrophysics;; Physics, Particles & Fields
Date of this Version
January 2008