Published in:

Applied Physics Letters 91,9 (2007) 093105 1-3;


A correlation between growth temperature and electrical resistance of multiwalled carbon nanotubes (MWNTs) has been established by measuring the resistance of individual MWNTs grown by microwave plasma-enhanced chemical vapor deposition (PECVD) at 800, 900, and 950 degrees C. The lowest resistances were obtained mainly from MWNTs grown at 900 degrees C. The MWNT resistance is larger on average at lower (800 degrees C) and higher (950 degrees C) growth temperatures. The resistance of MWNTs correlated well with other MWNT quality indices obtained from Raman spectra. This study identifies a temperature window for growing higher-quality MWNTs with fewer defects and lower resistance by PECVD.


Physics, Applied

Date of this Version

January 2007



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