Date of Award

January 2016

Degree Type


Degree Name

Doctor of Philosophy (PhD)


Electrical and Computer Engineering

First Advisor

Ali Shakouri

Committee Member 1

Charles Bouman

Committee Member 2

Mark Lundstrom

Committee Member 3

Ganesh Subbarayan


Electrothermal effects are crucial in the design and optimization of electronic devices. Thermoreflectance (TR) imaging enables transient thermal characterization at submicron to centimeter scales. Typically, finite element methods (FEM) are used to calculate the temperature profile in devices and ICs with complex geometry. By comparing theory and experiment, important material parameters and device characteristics are extracted. In this work we combine TR and FEM with image blurring/reconstruction techniques to improve electrothermal characterization of micron and nanoscale devices.