Date of Award
Doctor of Philosophy (PhD)
Electrical and Computer Engineering
Committee Member 1
Committee Member 2
Committee Member 3
Electrothermal effects are crucial in the design and optimization of electronic devices. Thermoreflectance (TR) imaging enables transient thermal characterization at submicron to centimeter scales. Typically, finite element methods (FEM) are used to calculate the temperature profile in devices and ICs with complex geometry. By comparing theory and experiment, important material parameters and device characteristics are extracted. In this work we combine TR and FEM with image blurring/reconstruction techniques to improve electrothermal characterization of micron and nanoscale devices.
Ziabari, Amir Koushyar, "FINITE ELEMENT AND IMAGING APPROACHES TO ANALYZE MULTISCALE ELECTROTHERMAL PHENOMENA" (2016). Open Access Dissertations. 1278.