Measurement of metal/carbon nanotube contact resistance by adjusting contact length using laser ablation

Chun Lan, Purdue University
Pornsak Srisungsitthisunti, Purdue University
Placidus B. Amama, Birck Nanotechnology Center, Purdue University
Timothy Fisher, Purdue University
Xianfan Xu, Birck Nanotechnology Center, School of Materials Engineering, Purdue University
R. Reifenberger, Birck Nanotechnology Center, Purdue University

Date of this Version

3-3-2008

This document has been peer-reviewed.

 

Abstract

A technique of measuring contact resistance between an individual nanotube and a deposited metallic film is described. Using laser ablation to sequentially shorten the contact length between a nanotube and the evaporated metallic film, the linear resistivity of the nanotube as well as the specific contact resistivity between the nanotube and metallic film can be determined. This technique can be generally used to measure the specific contact resistance that develops between a metallic film and a variety of different nanowires and nanotubes.

 

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