Microscale Temperature Measurements near the Contact Line of an Evaporating Thin Film in a V-Groove

Christopher P. Migliaccio, Birck Nanotechnology Center, Purdue University
H. K. Dhavaleswarapu, Purdue University
Suresh V. Garimella, Birck Nanotechnology Center, Purdue University

Date of this Version



Thin-film evaporation of heptane in a V-groove geometry is experimentally investigated. The groove is made of fused quartz, and electrical heating of a thin layer of titanium coated on the backside of the quartz substrate provides a constant heat flux. The effects of liquid feeding rate on the temperature suppression in the thin-film region and on the meniscus shape are explored. High resolution (∼6.3 μm) infrared thermography is employed to investigate the temperature profile in the thin-film region, while a goniometer is used to image the meniscus shape. An approximate heat balance analysis is used to estimate the fraction of total meniscus heat transfer which takes place in the contact line region.


Nanoscience and Nanotechnology