Microscale Temperature Measurements at the Triple Line of an Evaporating Thin Film

Hemanth K. Dhavaleswarapu, Birck Nanotechnology Center, Purdue University
Suresh V. Garimella, Birck Nanotechnology Center, Purdue University
Jayathi Y. Murthy, Birck Nanotechnology Center, Purdue University

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Thin-film evaporation from a meniscus in a confined space, which is the basis for many two-phase cooling devices, is experimentally investigated. The meniscus formed by heptane, a highly wetting liquid, on a heated, fused quartz substrate is studied. Microscale infrared temperature measurements performed near the thin-film region of the evaporating meniscus reveal the temperature suppression caused by the intensive evaporation in this region. The high spatial resolution (∼6.3 μm) and high temperature sensitivity (∼20 mK) of the infrared camera allowed for accurate measurements. The effects of meniscus thickness and applied heat flux on the thin-film heat transfer distribution and rate are also explored.


Nanoscience and Nanotechnology