Dynamics of surface-coupled microcantilevers in force modulation atomic force microscopy - magnetic vs. dither piezo excitation
Date of this Version
3-1-2012Citation
J. Appl. Phys. 111, 054303 (2012)
Abstract
Force modulation atomic force microscopy is widely used for mapping the nanoscale mechanical properties of heterogeneous or composite materials using low frequency excitation of a microcantilever scanning the surface. Here we show that the excitation mode - magnetic or dither piezo, has a major influence on the surface-coupled microcantilever dynamics. Not only is the observed material property contrast inverted between these excitation modes but also the frequency response of the surface-coupled cantilever in the magnetic mode is near-ideal with a clear resonance peak and little phase distortion thus enabling quantitative mapping of the local mechanical properties. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.3689815]
Discipline(s)
Nanoscience and Nanotechnology
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Comments
Copyright 2012 American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in J. Appl. Phys. 111, 054303 (2012) and may be found at http://dx.doi.org/10.1063/1.3689815. The following article has been submitted to/accepted by Journal of Applied Physics. Copyright 2012, Xin Xu, Marisol Koslowski and Arvind Raman. This article is distributed under a Creative Commons Attribution 3.0 Unported License.