High-speed atomic force microscopy in slow motion-understanding cantilever behaviour at high scan velocities
Date of this Version5-25-2012
High-speed atomic force microscopy in slow motion—understanding cantilever behaviour at high scan velocities O D Payton, L Picco, D Robert, A Raman, M E Homer, A R Champneys and M J Miles
Using scanning laser Doppler vibrometer we have identified sources of noise in contact mode high-speed atomic force microscope images and the cantilever dynamics that cause them. By analysing reconstructed animations of the entire cantilever passing over various surfaces, we identified higher eigenmode oscillations along the cantilever as the cause of the image artefacts. We demonstrate that these can be removed by monitoring the displacement rather than deflection of the tip of the cantilever. We compare deflection and displacement detection methods whilst imaging a calibration grid at high speed and show the significant advantage of imaging using displacement.
Nanoscience and Nanotechnology