Abstract

A new technique, which greatly facilitates the computer analysis of large-area multi-feature imagery, has been developed at the R.S.R.P. Called OWNMASK, the technique permits previous classification results for an area to be used to control new classifications of that area in such a way that both the number of features and the number of classes which must be considered for each pixel are reduced significantly, thereby reducing both human labor and computer costs.

Date of this Version

1975

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