"Experimental Characteristics of Frequency Modulated Noise of Compresso" by Y. H. Kim, J. M. Joo et al.

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International Compressor Engineering Conference

International Compressor Engineering Conference

Title

Experimental Characteristics of Frequency Modulated Noise of Compressor

Key

603

Conference Year

2000

Authors

Y. H. Kim, Samsung Electronics Co.
J. M. Joo, Samsung Electronics Co.
S. K. Oh, Samsung Electronics Co.

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