An emission-diffusion theory that describes MOSFETS from the ballistic to diffusive limits is developed. The approach extends the Crowell-Sze treatment of metalsemiconductor junctions to MOSFETs and is equivalent to the scattering/transmission model of the MOSFET. The paper demonstrates that the results of the transmission model can be obtained from a traditional, drift-diffusion analysis when the boundary conditions are properly specified, which suggests that traditional drift-diffusion MOSFET models can also be extended to comprehend ballistic limits.


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Emission–Diffusion Theory of the MOSFET Mark Lundstrom; Supriyo Datta; Xingshu Sun IEEE Transactions on Electron Devices Year: 2015, Volume: 62, Issue: 12 Pages: 4174 - 4178, DOI: 10.1109/TED.2015.2481886

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IEEE Transactions on Electron Devices, Vol. 62, pp. 4174-4178, 2015.



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