Anti-Stokes fluorescence imaging of microscale thermal fields in thin films

A. N. Kuzmin, State University of New York - Buffalo
A. Baev, State University of New York - Buffalo
A. V. Kachynski, State University of New York - Buffalo
Timothy S. Fisher, Birck Nanotechnology Center, Purdue University
Ali Shakouri, University of California - Santa Cruz; Birck Nanotechnology Center, Purdue University
P. N. Prasad, State University of New York - Buffalo

Date of this Version

8-1-2011

Citation

Journal of Applied Physics: Volume 110, Issue 3

Comments

Copyright (2011) American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in Journal of Applied Physics: Volume 110, Issue 3 and may be found at http://dx.doi.org/10.1063/1.3606429. The following article has been submitted to/accepted by Journal of Applied Physics. Copyright (2011) A. N. Kuzmin, A. Baev, A. V. Kachynski, T. S. Fisher, A. Shakouri, and P. N. Prasad. This article is distributed under a Creative Commons Attribution 3.0 Unported License.

Abstract

We demonstrate that the in-plane thin film heat transport can be accurately mapped via confocal anti-Stokes fluorescence imaging using fluorescent dye probes and nanoheaters. We employ 3D finite elements analysis to evaluate the thermal conductivity of a control sample and to assess the validity of a point heat source approximation. We have found that this approximation is adequate with use of a tightly focused laser beam, providing a robust means for determining the thermal conductivity of a sample under investigation. (C) 2011 American Institute of Physics. [doi:10.1063/1.3606429]

Discipline(s)

Nanoscience and Nanotechnology

 

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