Effects of Interface Roughness Scattering on Radio Frequency Performance of Silicon Nanowire Transistors
Date of this Version
2011Citation
not cited yet.
Abstract
The effects of an atomistic interface roughness in n-type silicon nanowire transistors (SiNWT) on the radio frequency performance are analyzed. Interface roughness scattering (IRS) is statistically investigated through a three dimensional full–band quantum transport simulation based on the sp3d5s∗ tight–binding model. As the diameter of the SiNWT is scaled down below 3 nm, IRS causes a significant reduction of the cut-off frequency. The fluctuations of the conduction band edge due to the rough surface lead to a reflection of electrons through mode-mismatch. This effect reduces the velocity of electrons and hence the transconductance considerably causing a cut-off frequency reduction.
Discipline(s)
Nanoscience and Nanotechnology
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Comments
accepted in Applied Physics Letters