Enhanced Thermal Contact Conductance Using Carbon Nanotube Array Interfaces
Date of this Version
June 2006Citation
IEEE Transactions on Ecomponents and Packaging Technologies, Vol. 29, No. 2, June 2006
This document has been peer-reviewed.
Abstract
Heat-conduction interfaces that employ carbon nanotube (CNT) arrays have been fabricated and studied experiementally using a reference calorimeter testing rig in a vacuum environment with infrared temperature measurements. Arrays of multiwalled CNTs are grown directly on silicon substrates with microwave plasma-enhanced chemical vapor deposition. Iron and nickel were used as CNT catalysts. CNT arrays grown under differnt synthesis conditions exhibit different pressure-contact conductance characteristics. The thermal contact resistance of CNTs with a copper interface exhibits promising results with a minimum value of 19.8 mm^2K/W at a pressure of 0.445 MPa.
Comments
DOI: 10.1109/TCAPT.2006.875876