Nanoelectronics: Metrology and Computation

Mark Lundstrom, Network for Computational Nanotechnology, Purdue University
Jason V. Clark, Network for Computational Nanotechnology, Purdue University
Gerhard Klimeck, Purdue University - Main Campus
Arvind Raman, Network for Computational Nanotechnology, Purdue University

Abstract

Research in nanoelectronics poses new challenges for metrology, but advances in theory, simulation and computing and networking technology provide new opportunities to couple simulation and metrology. This paper begins with a brief overview of current work in computational nanoelectronics. Three examples of how computation can assist metrology will then be discussed. The paper concludes with a discussion of how cyberinfrastructure can help connect computing and metrology using the nanoHUB (www.nanoHUB.org) as a specific example.