An investigation of the optical properties of disordered silicon nanowire mats
Date of this Version
12-15-2012Citation
J. Appl. Phys. 112, 124301 (2012)
Abstract
Optical reflectance spectra of three disordered silicon nanowire mats with average diameters of 40, 60, and 80 nm are investigated both experimentally and theoretically. The total hemispherical reflectance spectra from 200 to 1600 nm wavelength are first measured. All three samples exhibit reflectance about 15% to 20% within the ultraviolet band. As the wavelength becomes longer, the reflectance will first increase to around 50% and then decrease to below 20%. Such reflectance spectra are attributed to the combined effect of silicon dielectric function, the nanowire geometry, and the volume fraction of the mats. An analytical method based on Mie scattering theory and two-flux model is proposed to predict the reflectance spectra of the NW mats using only the physical quantities including dielectric function and structural parameters of the nanowire mats. The experimental reflectance spectra can be well reproduced by this method. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.4768913]
Discipline(s)
Nanoscience and Nanotechnology
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Copyright (2012) American Institute of Physics. This article may be downloaded for personal use only. Any other use requires prior permission of the author and the American Institute of Physics. The following article appeared in J. Appl. Phys. 112, 124301 (2012) and may be found at http://dx.doi.org/10.1063/1.4768913. The following article has been submitted to/accepted by Journal of Applied Physics. Copyright (2012) Hua Bao, Weixia Zhang, Liangliang Chen, Haoxiang Huang, Chen Yang and Xiulin Ruan. This article is distributed under a Creative Commons Attribution 3.0 Unported License.