This paper describes a test method which relies on the actual observation of supply current (I,,) waveforms. The method can be used to supplement the standard IDDe test method because it can 15e easily applied to dynamic logic circuits. The method allows us to detect faults which may not be detected by IDDe methods, and is sensitive enough to detect potential faults, which do not manifest themselves as functional errors. A simple built-in current sensol; which prove to be adequate in verifying the feasibility of using the ID, waveforms anczlysis to try to detect faults in CMOS circuits, is proposed to safely observe the current waveforms without sign$cantl~c, hanging the waveforms.
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