While estimating glitches or spurious transitions is challenge due to signal correlations, the random behavior of logic gate delays makes the estimation problem even more clifficult. In this paper, we present statistical estimation of signal activity at the internal and output nodes of combini3tional and sequential CMOS logic circuits considering uncertainty of gate delay models. The methodology is based on the stochastic models of logic signals and the probabilistic behavior of gate delays due to process variations, interconnect parmitics, etc. We propose a statistical technique of estimating average-case activity, which is flexible in adopting different delay models and variations and can be integrated with worst-case analysis into statistical logic design process. Experimental results show that the uncertainty of gate delay makes a great impact on activity at individual nodes (more than 100%) and total power dissipation as well.
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