Electrodynamic cavitation with nanoscale control
Abstract
The design and implementation of a new technique using an atomic force micro-scope (AFM) has allowed new and interesting studies to be performed with nanoscale spatial resolution. A new form of cavitation known as electrodynamic cavitation (EDC) was characterized and used to generate large structures on the surface of Si wafers. Oxide layers grown on Si/SiO2/H 2O and Si/SiO2/Au/H2O interfaces reached maximum heights of 130 nm and 690 nm, respectively. These structures represent a full order of magnitude increase in height over oxides grown in air under similar voltages and time durations. EDC was also used to perform in situ sharpening of a conducting AFM tip in high purity water with decreases in the radius of curvature of the AFM tips by 40% to 100%.
Degree
Ph.D.
Advisors
Simpson, Purdue University.
Subject Area
Analytical chemistry
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