Developing a system to investigate the effects of external electric fields on neuronal Z-projections using atomic force microscopy

Waranatha L Abeygunasekara, Purdue University

Abstract

The recent discovery of z-projections that were appearing and disappearing randomly over time from both the cell body and growth cone of the neuron has given rise to many questions regarding the implications of these projections on neural cell morphology, behavior and function. In more specific terms as to why these z-projections keep on appearing and grow vertically without any support structure and whether it is possible to induce and direct the growth of these apparently random structures with the aid of external stimuli. This study has developed an experimental setup that can be used to investigate the response of these z-projections to externally applied DC electric fields. The experimental setup was developed to be compatible with atomic force microscope, which allowed electric field application, z-projection detection and measurement of forces exerted by the z-projections at an individual neuron level. Using neuronally differentiated PC12 cells as a model system for neurons, a pilot data set has been collected to demonstrate the operation of the developed system and z-projections were detected for both positive and negative electric fields in the range of 15–161 mV/μm. Vertical forces applied by growing z-projections were in the range of 28–258 nN.

Degree

M.S.

Advisors

McNally, Purdue University.

Subject Area

Neurosciences|Electrical engineering|Nanotechnology

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