Accurate computer controlled on-wafer antenna measurement, data acquisition, and analysis

Drew M Campbell, Purdue University

Abstract

High frequency wireless applications are rapidly increasing with today's advanced silicon technologies. Many of these applications are falling into the unlicensed 60GHz frequency band. It has been proposed to exploit this frequency band for chip to chip communications. Wireless chip to chip communications allows for less signal degradation and transmission line losses. ^ Accurate characterization of an on-wafer antenna is a vital part of creating a efficient transceiver. To measure accurate antenna parameters an on-wafer antenna setup is developed, characterized, and tested. The computer controlled measurement system accurately controls antenna movement, data extraction, and data analysis. The test setup is used to analyze a newly developed on-wafer antenna. The measured on-wafer antenna results are compared to simulation data for the on-wafer antenna.^

Degree

M.S.

Advisors

John P. Denton, Purdue University.

Subject Area

Engineering, Electronics and Electrical

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